AIPHS

Adaptive Profiling HW Sub-system (AIPHS) supports designers on the development of On-Chip Monitoring Systems (OCMSs) able to satisfy given Monitorability Requirements

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CMA

CMA, acronym of Completeness Metric Analyzer, is a command-line tool for runtime monitoring of timing and State Machine status

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CompleteTest

Automatic Test Generation for Function Block Diagrams

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LIME Testbench

Runtime monitoring of model-based properties, and test case generation

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MATERA2

Model-based Monitoring from Åbo Akademi (MBMÅA) tool
Model-based Performance Testing (MBPeT) tool

Performance Exploration using Reinforcement Learning (PerfXRL) tool

MATERA2-Activity Diagram Conformance Tester

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VeriATL

Fine-Grained Incrementality for Deductive Verification of Model Transformations (Online)

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