Adaptive Profiling HW Sub-system (AIPHS) supports designers on the development of On-Chip Monitoring Systems (OCMSs) able to satisfy given Monitorability Requirements
EMF Views is an Eclipse plugin that brings the concept of database views to the modeling world
JTL is an EMF-based tool that allows you to design and manipulate models, maintain consistency and synchronize software artifacts, keep traceability during design.
Runtime monitoring of model-based properties, and test case generation
Model-based Monitoring from Åbo Akademi (MBMÅA) tool
Model-based Performance Testing (MBPeT) tool