Adaptive Profiling HW Sub-system (AIPHS) supports designers on the development of On-Chip Monitoring Systems (OCMSs) able to satisfy given Monitorability Requirements
CMA, acronym of Completeness Metric Analyzer, is a command-line tool for runtime monitoring of timing and State Machine status
EMF Views is an Eclipse plugin that brings the concept of database views to the modeling world
JTL is an EMF-based tool that allows you to design and manipulate models, maintain consistency and synchronize software artifacts, keep traceability during design.
The MegaM@Rt2 Eclipse IDE bundles together a number of Eclipse-based MegaM@Rt2 tools, namely:
Constellation organizes and manages collaborative (distributed) World Wide Modeling projects,