AIPHS

Adaptive Profiling HW Sub-system (AIPHS) supports designers on the development of On-Chip Monitoring Systems (OCMSs) able to satisfy given Monitorability Requirements

EMF Views

EMF Views is an Eclipse plugin that brings the concept of database views to the modeling world

JTL

JTL is an EMF-based tool that allows you to design and manipulate models, maintain consistency and synchronize software artifacts, keep traceability during design.

LIME Testbench

Runtime monitoring of model-based properties, and test case generation

MATERA2

Model-based Monitoring from Åbo Akademi (MBMÅA) tool
Model-based Performance Testing (MBPeT) tool

Modelio Constellation

Constellation organizes and manages collaborative (distributed) World Wide Modeling projects,